Study La0.5Sr1.5MnO4with Multi-Beam X-ray Diffraction
نویسندگان
چکیده
منابع مشابه
Triplet-phase measurements using reference-beam X-ray diffraction.
Reference-beam diffraction (RBD) is a recently developed phase-sensitive X-ray diffraction technique that incorporates the principle of multiple-beam diffraction into the standard oscillating-crystal data-collection method [Shen (1998). Phys. Rev. Lett. 80, 3268-3271]. Using this technique, a large number of multiple-beam interference profiles can be recorded simultaneously on an area detector,...
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Methods for carrying out coherent X-ray scattering experiments are reviewed. The brilliance of the available synchrotron sources, the characteristics of the existing optics, the various ways of obtaining a beam of controlled coherence properties and the detectors used are summarized. Applications in the study of the dynamics of speckle patterns are described. In the case of soft condensed matte...
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Fig 1: The solid points give the location and shape of the (1 0 –4) resonant reflection in orthorhombic LaMnO3. Open circles display Mn Kα fluorescence from the same sample on a common energy scale. The vertical scale is arbitrary and the lines are guides to the eye. In conventional X-ray diffraction the beam scatters from all electrons in the unit cell, but in resonant diffraction at a forbidd...
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A new method of obtaining Bragg reflection phases in an x-ray diffraction experiment is presented. It combines the phase-sensitive principles of multiple-beam diffraction and x-ray standing waves, and allows direct phase measurements of many multiple reflections simultaneously using a Bragg-inclined oscillating-crystal geometry. A modified-two-beam intensity function is devised to extract the p...
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We demonstrate material phase identification by measuring polychromatic diffraction spots from samples at least 20 mm in diameter and up to 10 mm thick with an energy resolving point detector. Within our method an annular X-ray beam in the form of a conical shell is incident with its symmetry axis normal to an extended polycrystalline sample. The detector is configured to receive diffracted flu...
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ژورنال
عنوان ژورنال: Acta Crystallographica Section A Foundations and Advances
سال: 2014
ISSN: 2053-2733
DOI: 10.1107/s2053273314096089